The Advanced Micro- and Nanostructure Characterization (AMNC) group at the Department of Materials Science is dedicated to unraveling the mysteries hidden within the tiniest building blocks of matter. Our mission is to pioneer cutting-edge techniques that span from the microscale down to the atomic level, enabling us to peer into the heart of materials like never before.

Our primary focus lies in establishment and further development of cross-correlative high resolution characterization techniques with special emphasis being laid on atom probe tomography (APT). Complementary application of advanced imaging techniques, including scanning- as well as transmission electron microscopy (SEM and TEM) and utilization of related analytical techniques such as electron backscatter diffraction (EBSD) or transmission Kikuchi diffraction (TKD) as well energy-dispersive X-ray spectroscopy (EDS) provide crucial insights into elemental composition, phase identification and grain orientation of materials. With that unique portfolio of cutting edge characterization facilities at our department, we explore thin films, nanoparticles, interfaces, defects, and dopant distributions, driving innovations in materials science and engineering.

As collaborators and educators, we welcome partnerships with fellow researchers and institutions, fostering a community of knowledge exchange. Our commitment to pushing the boundaries of what's possible in micro and nanostructure characterization drives us to constantly innovate, ensuring that we remain at the forefront of this exciting field.

Join us in our quest to uncover the hidden world of atoms and nanostructures, as we pave the way for transformative breakthroughs in science and technology.